XPS & TOF-SIMS seminar

The LTA is launching its High-Performance Chemical Analysis and Imaging Platform, which has capabilities unique in Switzerland.


Thursday November 14th, 2019 at 10h30

Ecole de physique, 24 quai E.-Ansermet, Geneva
Grand Auditoire

Our platform combines expertise in the field of molecular identification and surface chemistry, with two state-of-the-art machines: a PHI nanoTOF II TOF-SIMS mass spectrometer with parallel MS/MS imaging and a PHI VersaProbe III scanning XPS microprobe.

Both academic and industrial laboratories will be able to take advantage of what this equipment has to offer, and the scientific know-how of this platform, to meet their technological challenges in a wide range of fields of activity.

These two complementary techniques allow, among other things, a quantitative analysis of elements and molecules. They represent a real asset for research, and support for innovation, at a regional and national level.

Come and discover the potential of this new platform, which is unique in Switzerland.  During this seminar, experts will be available to discuss the potential of the XPS and TOF-SIMS techniques in your field of activity, and to answer your questions. A personalised meeting to discuss your projects, including a visit to the laboratory, can be arranged at your convenience.



Welcome & coffee


Presentation of the High-Performance Chemical Analysis and Imaging Platform

Prof. Christoph Renner
Professor at the University of Geneva and president of the LTA


Advances in  XPS and TOF-SIMS for Surface Chemical Analysis

Dr. Scott R. Bryan
President de Physical Electronics USA

more information about Scott Bryan

Scott earned a B.S. degree in Chemistry from the University of Minnesota in 1982, he went on to graduate school at The University of North Carolina in Chapel Hill where he received his Ph.D. in Analytical Chemistry in 1986 under the direction of Professor Richard Linton.  His dissertation was on the development of microcomputer based digital imaging system for extending SIMS to 3D elemental analysis of materials.

Upon graduation, he joined British Petroleum in Ohio as team leader of the Surface Analysis Group.  At BP America he used Auger, XPS, and SIMS to study ceramics, catalysts, polymers, and minerals.  He left BP at the end of 1993 to join Physical Electronics to work on the commercialization of the first PHI TOF-SIMS.  In 2008 he was appointed Vice President and then in 2010 promoted to President of PHI responsible for all US operations.  Over the past 30 years Scott has published 50 peer reviewed papers and made numerous presentations at both national and international conferences.


First results from our team

Dr. Siobhan McKeown & Dr. Andras Kiss
Scientists responsible for the platform


Lunch and discussions


Interactive demonstration

We will show-case the capabilities of our TOF-SIMS in real-time, with a remote interactive demonstration.



Registration is open until November 8th, 2019


A question about the event?

Send an email to info@lta-geneve.ch

A question about the platform?

click here

A question about the LTA?

please contact one of our scientific liaison officers and follow us on social media