The crystal growth and materials processing laboratory has just acquired a new bench-top X-ray powder diffractometer AERIS Research edition from PANalytical, particularly suitable for rapid phase identification and for multi-user environments. The diffractometer is configured in Bragg-Brentano geometry with a radius of 145 mm. Thanks to the LFF Empyrean X-ray source and the PIXcel-1D line detector, this system is fast and precise.

Data processing is performed by HighScore software, which includes a search match algorithm using peak and profile data, line profile analysis options, quantitative phase estimation tools and is compatible with reference databases.