The LTA is launching a High-Performance Chemical Analysis and Imaging Platform! The platform is open to both academic and industrial laboratories. Discover more at the XPS and TOF-SIMS seminar on November 14th. This platform, unique in Switzerland, combines expertise in molecular identification and surface chemistry with two state-of-the-art systems: a TOF-SIMS mass spectrometer and a scanning XPS microprobe. These two complementary techniques allow sensitive and quantitative analysis of elemental and molecular composition, of a great variety of materials. The breadth of possible applications, ranging from the study of multilayer electronic devices to organic tissue, make this platform a real asset to research and innovation in diverse fields.