Two new machines, a TOF-SIMS mass spectrometer with analytical capabilities that are the first of their kind in Switzerland, and a scanning XPS microprobe, are in the process of being installed by our scientists and the Physical Electronics team. These two complementary techniques are capable of quantitative and extremely sensitive identification of elements and molecules with the ability to perform both imaging and depth profiling. Academic and industry laboratories alike will soon be able to take advantage of what these systems have to offer. Stay tuned!